L. W. Lee, M. Stefenelli, Agala Joel Baldevia, N. Evelyn
{"title":"Understanding of within Chip variation of optical appearance of Aluminum Pads","authors":"L. W. Lee, M. Stefenelli, Agala Joel Baldevia, N. Evelyn","doi":"10.1109/EPTC.2018.8654354","DOIUrl":null,"url":null,"abstract":"An electro assisted advanced adhesion promoter process is used to increase the mechanical and chemical robustness between mold compound and metal areas in the package [1], [2]. As quality monitoring method optical inspection is used. Where, for one product, a significant color difference between bond pads within a chip was observed. Our investigations proved that the color differences after the plating process are mainly due to the electrical characteristic of the specific chip in the specific product leading to electronegative static charge on individual bond pads.","PeriodicalId":360239,"journal":{"name":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 20th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2018.8654354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
An electro assisted advanced adhesion promoter process is used to increase the mechanical and chemical robustness between mold compound and metal areas in the package [1], [2]. As quality monitoring method optical inspection is used. Where, for one product, a significant color difference between bond pads within a chip was observed. Our investigations proved that the color differences after the plating process are mainly due to the electrical characteristic of the specific chip in the specific product leading to electronegative static charge on individual bond pads.