Cost of yield

D. Maynard, D. Kerr, C. Whiteside
{"title":"Cost of yield","authors":"D. Maynard, D. Kerr, C. Whiteside","doi":"10.1109/ASMC.2003.1194488","DOIUrl":null,"url":null,"abstract":"Every semiconductor manufacturer carefully manages fixed and variable costs to achieve profitability. Usually this is well defined in terms of facilities, equipment, labor, and materials, and for the high volume single product producer, the story is complete. Allocating a factory's capacity across several or many products quickly complicates the picture, and the engineering staff is forced to prioritize issues across product subsets. Cost of yield (COY) is a measure of the additional dollars debited (credited) to production expenses when the aggregate productivity falls below (exceeds) the business plan. It provides a way to understand the economic impact of yield variation from the plan weighted by the costs and volumes of each product. COY has been calculated at IBM Microelectronics since 1995 when the division moved to a \"Standard Cost\" accounting system, and it continues to be an important business management tool. The management staff interprets COY data to validate resource allocations and insure the deployment of the correct activities that cover the products with the largest COY variances. In fact, COY can be subdivided by a number of dimensions, and the implications of these analysis reaches beyond the realm of accounting. A manufacturer develops the cost targets during its planning cycle by projecting productivities (and yield). Measuring COY validates and audits the planning process, and large COY variances trigger profit motivation questions. Moreover, the manufacturer can make an informed decision as to when to scrap degraded hardware. This paper discusses the mechanics of the COY calculation and illustrates the concepts with analysis examples. Suggested integration into and investigation by the manufacturing engineering community are shown. Gaining a true understanding of how specific decisions affect yield in terms of actual dollars forces the design community to be accountable for conscience yield-limiting decisions, and provides the right benefit measure of some design-for-manufacturing initiatives. Finally, the senior business decision makers can assemble an enterprise-level COY perspective to guide future investment and actions.","PeriodicalId":178755,"journal":{"name":"Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI","volume":"2 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2003.1194488","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Every semiconductor manufacturer carefully manages fixed and variable costs to achieve profitability. Usually this is well defined in terms of facilities, equipment, labor, and materials, and for the high volume single product producer, the story is complete. Allocating a factory's capacity across several or many products quickly complicates the picture, and the engineering staff is forced to prioritize issues across product subsets. Cost of yield (COY) is a measure of the additional dollars debited (credited) to production expenses when the aggregate productivity falls below (exceeds) the business plan. It provides a way to understand the economic impact of yield variation from the plan weighted by the costs and volumes of each product. COY has been calculated at IBM Microelectronics since 1995 when the division moved to a "Standard Cost" accounting system, and it continues to be an important business management tool. The management staff interprets COY data to validate resource allocations and insure the deployment of the correct activities that cover the products with the largest COY variances. In fact, COY can be subdivided by a number of dimensions, and the implications of these analysis reaches beyond the realm of accounting. A manufacturer develops the cost targets during its planning cycle by projecting productivities (and yield). Measuring COY validates and audits the planning process, and large COY variances trigger profit motivation questions. Moreover, the manufacturer can make an informed decision as to when to scrap degraded hardware. This paper discusses the mechanics of the COY calculation and illustrates the concepts with analysis examples. Suggested integration into and investigation by the manufacturing engineering community are shown. Gaining a true understanding of how specific decisions affect yield in terms of actual dollars forces the design community to be accountable for conscience yield-limiting decisions, and provides the right benefit measure of some design-for-manufacturing initiatives. Finally, the senior business decision makers can assemble an enterprise-level COY perspective to guide future investment and actions.
产量成本
每个半导体制造商都仔细管理固定和可变成本,以实现盈利。通常,这在设施、设备、劳动力和材料方面都有很好的定义,对于大批量的单一产品生产商来说,这个故事是完整的。将工厂的产能分配到几个或许多产品上,很快就会使情况变得复杂,工程人员被迫在产品子集之间确定问题的优先级。产量成本(COY)是衡量当总生产率低于(超过)商业计划时记入(记入)生产费用的额外美元。它提供了一种方法来理解由每种产品的成本和体积加权的计划的产量变化的经济影响。自1995年IBM微电子部门转向“标准成本”会计系统以来,一直在计算COY,并且它仍然是一个重要的业务管理工具。管理人员解释COY数据以验证资源分配,并确保部署涵盖COY差异最大的产品的正确活动。事实上,COY可以被细分为多个维度,这些分析的含义超出了会计领域。制造商在其计划周期中通过预测生产率(和产量)来制定成本目标。测量COY可以验证和审计计划过程,而较大的COY差异会引发利润动机问题。此外,制造商可以做出明智的决定,何时报废退化的硬件。本文讨论了COY计算的原理,并用分析实例说明了其中的概念。建议整合和调查制造工程界显示。获得对具体决策如何影响实际收益的真正理解,将迫使设计界对限制产量的决策负责,并为一些为制造而设计的计划提供正确的效益衡量标准。最后,高级业务决策者可以组合一个企业级的COY视角来指导未来的投资和行动。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信