Aliasing-free signature analysis for RAM BIST

Abstract

Signature analyzers are very efficient output response compactors in BIST techniques. The only limitation of signature analysis is the fault coverage reduction (aliasing) due to the information loss inherent to any data compaction. In this paper, in order to increase the effectiveness of RAM BIST, we fake advantage from the regularity of the RAM test algorithms and we show that aliasing-free signature analysis can be achieved in RAM BIST.