J. Henkel, O. Bringmann, A. Herkersdorf, W. Rosenstiel, N. Wehn
{"title":"Dependable embedded systems: The German research foundation DFG priority program SPP 1500","authors":"J. Henkel, O. Bringmann, A. Herkersdorf, W. Rosenstiel, N. Wehn","doi":"10.1109/ETS.2012.6233053","DOIUrl":null,"url":null,"abstract":"When migrating to future technology nodes, dependability becomes a major design problem as variability, aging and susceptibility to soft errors increase. The purpose of this program is to research cross-layer solutions that address the physical problems at system-level i.e. at hardware-level, operating system level, application level etc. The goals and an overview of the DFG SPP 1500 research program are presented.","PeriodicalId":429839,"journal":{"name":"2012 17th IEEE European Test Symposium (ETS)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 17th IEEE European Test Symposium (ETS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ETS.2012.6233053","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
When migrating to future technology nodes, dependability becomes a major design problem as variability, aging and susceptibility to soft errors increase. The purpose of this program is to research cross-layer solutions that address the physical problems at system-level i.e. at hardware-level, operating system level, application level etc. The goals and an overview of the DFG SPP 1500 research program are presented.