Haodong Hu, H. Gong, Wenhui Xu, Yibo Wang, T. You, G. Han, Jiandong Ye, Xin Ou, Yan Liu, Yi Hao
{"title":"DC Characteristics of the p-NiOx/n-Ga2O3 Junction FETs Based on Heterointegrated Ga2O3-on-SiC by Ion Cutting Process","authors":"Haodong Hu, H. Gong, Wenhui Xu, Yibo Wang, T. You, G. Han, Jiandong Ye, Xin Ou, Yan Liu, Yi Hao","doi":"10.7567/ssdm.2021.d-6-04","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":185590,"journal":{"name":"Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.7567/ssdm.2021.d-6-04","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}