PZT piezoelectric coefficient extraction by PZT-actuated micro-beam characterization and modeling

F. Casset, M. Cueff, A. Suhm, G. Le Rhun, J. Abergel, M. Allain, C. Dieppedale, T. Ricart, S. Fanget, P. Renaux, D. Faralli, P. Ancey, A. Devos, E. Defay
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引用次数: 7

Abstract

In this paper, we showed the realization and the characterization of a PZT-actuated micro-cantilever. The measurement and the modeling of its resonant frequency allow deducing the cantilever length. Using this value and combining the measurement and the modeling of the cantilever displacement amplitude at a given voltage, we extract PZT d31 piezoelectric coefficient as being 165±25 pm/V; which is among the highest values ever published for PZT thin films. It is worth noting that d31 is homogenous throughout the whole 200mm wafer.
基于PZT驱动微梁特性与建模的压电系数提取
在本文中,我们展示了压电陶瓷驱动微悬臂梁的实现和特性。通过对其谐振频率的测量和建模,可以推导出悬臂梁的长度。利用该值,结合给定电压下悬臂位移幅值的测量和建模,我们提取出pztd31压电系数为165±25 pm/V;这是有史以来公布的PZT薄膜的最高值。值得注意的是,d31在整个200mm晶圆上是均匀的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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