N. Mahatme, I. Chatterjee, S. Jagannathan, N. Gaspard, T. Assis, S. Wen, R. Wong, B. Bhuva
{"title":"Exploiting low power circuit topologies for soft error mitigation","authors":"N. Mahatme, I. Chatterjee, S. Jagannathan, N. Gaspard, T. Assis, S. Wen, R. Wong, B. Bhuva","doi":"10.1109/IRPS.2016.7574640","DOIUrl":null,"url":null,"abstract":"Alpha particle experimental results for arithmetic circuits implemented using transmission gate logic are shown to have 35% lower soft error rate as well as 30% lower power consumption compared to standard CMOS circuits. Analytical models confirm the experimental trends and help optimize and predict the power-SER trade-off.","PeriodicalId":172129,"journal":{"name":"2016 IEEE International Reliability Physics Symposium (IRPS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2016.7574640","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Alpha particle experimental results for arithmetic circuits implemented using transmission gate logic are shown to have 35% lower soft error rate as well as 30% lower power consumption compared to standard CMOS circuits. Analytical models confirm the experimental trends and help optimize and predict the power-SER trade-off.