SU-8 as an electron beam lithography resist

F. Williamson, E. Shields
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引用次数: 6

Abstract

SU-8 resist is an epoxy resin dissolved with a photoinitiator in an organic solvent. The result is a negative resist originally developed for high aspect ratio MEMS applications. For some applications SU-8 has several advantages over the most commonly used e-beam resist, PMMA, which include a much higher sensitivity and increased chemical and mechanical robustness. We have used our Raith 150 electron beam lithography tool to investigate SU-8 in two different applications. First, we investigated the properties of a specially formulated SU-8 which can be spun as thin as /spl sim/100 nm. This is much thinner than normal formulations but necessary for high-resolution lithography. We then exposed an array of single pixel lines with a pitch of 200 nm. At a dose of 30 pC/cm we obtained a line width of /spl sim/60 nm. Second, using standard formulations of SU-8, we discovered that films as thick as 8 microns can be exposed with a 30 kV electron beam, the maximum of our system. Using the contrast curve as a calibration reference, we were able to make analog three-dimensional structures by spatially varying the dose as the feature is being written. With this technique we fabricated a 3/spl times/3 array of f/9 spherical lenses.
SU-8作为电子束光刻抗蚀剂
SU-8抗蚀剂是一种用光引发剂溶解在有机溶剂中的环氧树脂。其结果是最初为高纵横比MEMS应用开发的负阻。对于某些应用,SU-8比最常用的电子束抗腐蚀剂PMMA有几个优点,包括更高的灵敏度和更高的化学和机械坚固性。我们使用Raith 150电子束光刻工具在两种不同的应用中研究SU-8。首先,我们研究了一种特殊配方的SU-8的性能,它可以纺得薄至/spl sim/100 nm。这比普通配方薄得多,但对于高分辨率光刻是必要的。然后,我们曝光了一组间距为200纳米的单像素线。在30 pC/cm的剂量下,我们获得了/spl sim/60 nm的线宽。其次,使用SU-8的标准配方,我们发现厚度为8微米的薄膜可以用30千伏的电子束暴露,这是我们系统的最大值。使用对比曲线作为校准参考,我们能够通过在空间上改变剂量来制作模拟三维结构。利用这种技术,我们制作了一个3/spl倍/3的f/9球面透镜阵列。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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