Shi-Yu Huang, K. Cheng, Kuang-Chien Chen, D. I. Cheng
{"title":"ErrorTracer: a fault simulation-based approach to design error diagnosis","authors":"Shi-Yu Huang, K. Cheng, Kuang-Chien Chen, D. I. Cheng","doi":"10.1109/TEST.1997.639713","DOIUrl":null,"url":null,"abstract":"This paper addresses the problem of locating error sources in an erroneous combinational circuit. We use a fault simulation-based technique to approximate each signal's correcting power. The correcting power of a particular signal is measured in terms of the signal's correctable set, namely, the maximum set of erroneous input vectors that can be corrected by re-synthesizing the signal. Only the signals that can correct every erroneous input vector are considered as a potential error source. Our algorithm offers three major advantages over existing methods. First, unlike symbolic approaches, it is applicable for large circuits. Secondly, it delivers more accurate results than other simulation-based approaches because it is based on a more stringent condition for identifying potential error sources. Thirdly, it can be easily generalized to identify multiple errors. Experimental results on diagnosing circuits with one and two random errors are presented to show the effectiveness and efficiency of this new approach.","PeriodicalId":186340,"journal":{"name":"Proceedings International Test Conference 1997","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"48","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings International Test Conference 1997","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1997.639713","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 48
Abstract
This paper addresses the problem of locating error sources in an erroneous combinational circuit. We use a fault simulation-based technique to approximate each signal's correcting power. The correcting power of a particular signal is measured in terms of the signal's correctable set, namely, the maximum set of erroneous input vectors that can be corrected by re-synthesizing the signal. Only the signals that can correct every erroneous input vector are considered as a potential error source. Our algorithm offers three major advantages over existing methods. First, unlike symbolic approaches, it is applicable for large circuits. Secondly, it delivers more accurate results than other simulation-based approaches because it is based on a more stringent condition for identifying potential error sources. Thirdly, it can be easily generalized to identify multiple errors. Experimental results on diagnosing circuits with one and two random errors are presented to show the effectiveness and efficiency of this new approach.