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DEGRADATION OP OFF-STATE LEAKAGE IN PMOS TRANSISTORS UNDER HOT CARRIER INJECTION

Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS) Pub Date : 1900-01-01 DOI:10.1109/IRWS.1994.515828
C.H.J. Huang, T. Rost, J. McPherson
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热载流子注入下pmos晶体管的劣化失态泄漏
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Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
Proceedings of 1994 IEEE International Integrated Reliability Workshop (IRWS)
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