High density SMT assemblies based on flex substrates

R. Larmouth, J. Keating
{"title":"High density SMT assemblies based on flex substrates","authors":"R. Larmouth, J. Keating","doi":"10.1109/ELECTR.1998.682105","DOIUrl":null,"url":null,"abstract":"The industry trend to shrink semiconductor device packages while increasing I/O count results in demands on the printed circuit boards to which these devices are assembled. An increase in wiring density is required at the board level, often equating to higher costs and/or layer counts. In many cases, designers are looking to multilayer flexible circuits as the next level of interconnect for a wide range of packaging technologies from fine-pitch surface mount to chip-scale packages to direct-chip attach. Challenges associated with a flex-based solution include assembly compatibility, material costs and reliability. This paper reviews work by Teledyne Electronic Technologies (TET) to address these board level interconnect challenges for several custom applications. An approach employing flexible multilayer substrates which incorporate fine-line circuitry, small vias and flexible soldermask is examined. A test vehicle designed and built to accommodate micro-BGA packages is used to illustrate the density achieved and to provide a platform for demonstrating assembly and reliability attributes. This test vehicle is also being used to evaluate materials and process technologies applicable to high density SMT assemblies.","PeriodicalId":402966,"journal":{"name":"Professional Program Proceedings. Electro 98 (Cat. No.98CH36240)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Professional Program Proceedings. Electro 98 (Cat. No.98CH36240)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELECTR.1998.682105","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

The industry trend to shrink semiconductor device packages while increasing I/O count results in demands on the printed circuit boards to which these devices are assembled. An increase in wiring density is required at the board level, often equating to higher costs and/or layer counts. In many cases, designers are looking to multilayer flexible circuits as the next level of interconnect for a wide range of packaging technologies from fine-pitch surface mount to chip-scale packages to direct-chip attach. Challenges associated with a flex-based solution include assembly compatibility, material costs and reliability. This paper reviews work by Teledyne Electronic Technologies (TET) to address these board level interconnect challenges for several custom applications. An approach employing flexible multilayer substrates which incorporate fine-line circuitry, small vias and flexible soldermask is examined. A test vehicle designed and built to accommodate micro-BGA packages is used to illustrate the density achieved and to provide a platform for demonstrating assembly and reliability attributes. This test vehicle is also being used to evaluate materials and process technologies applicable to high density SMT assemblies.
基于柔性基板的高密度SMT组件
在增加I/O数量的同时,缩小半导体器件封装的行业趋势导致对组装这些器件的印刷电路板的需求增加。在电路板层面需要增加布线密度,通常等同于更高的成本和/或层数。在许多情况下,设计人员正在寻找多层柔性电路作为各种封装技术的下一级互连,从细间距表面贴装到芯片级封装,再到直接芯片连接。与柔性解决方案相关的挑战包括装配兼容性、材料成本和可靠性。本文回顾了Teledyne电子技术公司(TET)为解决这些板级互连挑战所做的工作。研究了一种采用柔性多层衬底的方法,该方法结合了细线电路、小过孔和柔性焊罩。为容纳微型bga封装而设计和制造的测试车辆用于说明所达到的密度,并为演示组装和可靠性属性提供了一个平台。该测试车还用于评估适用于高密度SMT组件的材料和工艺技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信