{"title":"Design Optimization of a Breakdown Silicon Controlled Rectifier (BDSCR) for Cell Phone Antenna Switch Pin Electrostatic Discharge (ESD) Protection","authors":"Lin Lin, R. Gauthier, A. Loiseau, X. Lu","doi":"10.23919/EOS/ESD.2018.8509768","DOIUrl":null,"url":null,"abstract":"A new Breakdown Silicon-Controlled-Rectifier (BDSCR) developed for effective ESD protection on antenna ports in cell phone applications is presented in an 180nm silicon-on-insulator (SOI) technology. The new OPPC-BDSCR design achieved leakage, breakdown voltage scaling and ESD requirements.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509768","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A new Breakdown Silicon-Controlled-Rectifier (BDSCR) developed for effective ESD protection on antenna ports in cell phone applications is presented in an 180nm silicon-on-insulator (SOI) technology. The new OPPC-BDSCR design achieved leakage, breakdown voltage scaling and ESD requirements.