{"title":"A testset for automatic characterisation of opamps in the frequency domain","authors":"C. Van Grieken, W. Sansen","doi":"10.1109/ICMTS.1993.292889","DOIUrl":null,"url":null,"abstract":"A new test set is described. It allows fully automatic measurements of the open loop gain, the common mode rejection ratio (CMRR), and the power supply rejection ratios of operational amplifiers in the frequency domain. New features include an improved method for CMRR measurement, a large frequency range (0.1 Hz to 10 MHz), and the absence of wiring to be changed by the user for the different measurements.<<ETX>>","PeriodicalId":123048,"journal":{"name":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1993.292889","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
Abstract
A new test set is described. It allows fully automatic measurements of the open loop gain, the common mode rejection ratio (CMRR), and the power supply rejection ratios of operational amplifiers in the frequency domain. New features include an improved method for CMRR measurement, a large frequency range (0.1 Hz to 10 MHz), and the absence of wiring to be changed by the user for the different measurements.<>