{"title":"A technique for electrically measuring the thermal resistance of GaAs bulk resistors","authors":"E. Sabin, J. Scarpulla, Y. Chou, G. Shimamoto","doi":"10.1109/GAASRW.2000.902421","DOIUrl":null,"url":null,"abstract":"An electrical technique to measure the thermal resistance of GaAs bulk resistors is presented. The thermal resistance of several resistors was determined. The difference in these results relative to a liquid crystal method is discussed. Then, the reliability impact on the resistors from self-heating is studied.","PeriodicalId":199689,"journal":{"name":"2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/GAASRW.2000.902421","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
An electrical technique to measure the thermal resistance of GaAs bulk resistors is presented. The thermal resistance of several resistors was determined. The difference in these results relative to a liquid crystal method is discussed. Then, the reliability impact on the resistors from self-heating is studied.