A parallel measurement system for the extraction of level 3 SPICE parameters

International Conference on Microelectronic Test Structures Pub Date : 1990-03-05 DOI:10.1109/ICMTS.1990.67893

A. A. Walker, P. Touhy, A. Walton, J. Robertson

引用次数: 9

Abstract

A fast and cost-efficient system to measure level-3 SPICE parameters is described. The extraction process takes 30 measurements in 18 measurement cycles using six MOSFETs and an oxide capacitor. Many of the measurements are performed in parallel and this significantly reduces the combined measurement and extraction time.<>

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一种用于3级SPICE参数提取的平行测量系统

介绍了一种快速、经济的3级SPICE参数测量系统。提取过程需要在18个测量周期中使用6个mosfet和一个氧化物电容器进行30次测量。许多测量是并行执行的，这大大减少了组合测量和提取时间。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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International Conference on Microelectronic Test Structures

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