{"title":"Cycle time reduction at a major Texas Instruments wafer fab","authors":"K. Potti, M. Whitaker","doi":"10.1109/ASMC.2003.1194477","DOIUrl":null,"url":null,"abstract":"This paper highlights the strategic and tactical applications of simulation modeling and how it was used to reduce cycle time at a major Texas Instruments wafer fab.","PeriodicalId":178755,"journal":{"name":"Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Semiconductor Manufacturing Conference and Workshop, 2003 IEEEI/SEMI","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASMC.2003.1194477","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
This paper highlights the strategic and tactical applications of simulation modeling and how it was used to reduce cycle time at a major Texas Instruments wafer fab.