Board Level FBGA Package Combined Thermal Cycling & Bending Fatigue Study

Hui Wang, Jianwei Zhou, Taekoo Lee, Jun Wang, F. Xiao
{"title":"Board Level FBGA Package Combined Thermal Cycling & Bending Fatigue Study","authors":"Hui Wang, Jianwei Zhou, Taekoo Lee, Jun Wang, F. Xiao","doi":"10.1109/ICEPT.2005.1564672","DOIUrl":null,"url":null,"abstract":"A combined thermal cycling and bending fatigue test method is proposed for board level FBGA package. The fatigue lifetime of the board level FBGA package is studied with the combined acceleration method both with experimental and numerical analysis. The influence of initial pre-temperature cycling treatment on the bending fatigue life is studied. The failure analysis of failed samples was conducted, cracks were found in different sites of the package. The numerical analysis of the combined temperature cycle test and bending test was conducted. The simulation results of fatigue lifetime and failure site correspond to the experiment result well","PeriodicalId":234537,"journal":{"name":"2005 6th International Conference on Electronic Packaging Technology","volume":"150 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 6th International Conference on Electronic Packaging Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2005.1564672","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

A combined thermal cycling and bending fatigue test method is proposed for board level FBGA package. The fatigue lifetime of the board level FBGA package is studied with the combined acceleration method both with experimental and numerical analysis. The influence of initial pre-temperature cycling treatment on the bending fatigue life is studied. The failure analysis of failed samples was conducted, cracks were found in different sites of the package. The numerical analysis of the combined temperature cycle test and bending test was conducted. The simulation results of fatigue lifetime and failure site correspond to the experiment result well
板级FBGA封装组合热循环&弯曲疲劳研究
提出了板级FBGA封装的热循环与弯曲疲劳联合试验方法。采用实验和数值分析相结合的加速方法对板级FBGA封装的疲劳寿命进行了研究。研究了初始预温循环处理对弯曲疲劳寿命的影响。对失效试样进行了失效分析,在包装的不同部位发现了裂纹。对复合温度循环试验和弯曲试验进行了数值分析。疲劳寿命和失效部位的模拟结果与试验结果吻合较好
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信