STEM: a framework for simulating and selecting I/sub DDQ/ measurement points for leakage faults

Abstract

An efficient algorithm, named state transition based method (STEM), for simulating I/sub DDQ/ tests for leakage faults is presented. It also provides an efficient framework for "incremental fault simulation" which is embedded in the problem of selecting optimal I/sub DDQ/ measurement points for leakage faults, STBM can be used for both combinational and sequential circuits. Experimental results show that STEM outperforms all known fault simulation algorithms and optimal loop measurement point selection algorithms for leakage faults.