{"title":"Modular fault simulation of mixed signal circuits with fault ranking by severity","authors":"A. Gomes, R. Voorakaranam, A. Chatterjee","doi":"10.1109/DFTVS.1998.732184","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a novel approach to fault simulation of large mixed signal circuits using circuit partitioning and fault ordering. The conventional statistical fault model is divided, to separately account for global and local variations. We consider the problem of estimating the effect of a parameter deviation in a sub-module, on the system level specifications for a general nonlinear circuit. This method uses a function approximation model to estimate the system response and rank the faults according to the severity. Applications of this algorithm include estimation of fault coverage and forms a key element in test generation and diagnosis procedures.","PeriodicalId":245879,"journal":{"name":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Cat. No.98EX223)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1998.732184","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10
Abstract
In this paper, we propose a novel approach to fault simulation of large mixed signal circuits using circuit partitioning and fault ordering. The conventional statistical fault model is divided, to separately account for global and local variations. We consider the problem of estimating the effect of a parameter deviation in a sub-module, on the system level specifications for a general nonlinear circuit. This method uses a function approximation model to estimate the system response and rank the faults according to the severity. Applications of this algorithm include estimation of fault coverage and forms a key element in test generation and diagnosis procedures.