Implementation of Defect Oriented Testing and ICCQ testing for industrial mixed-signal IC

Abstract

In the era of Zero Defects, ICCQ is one of the powerful non-specification based testing methods to achieve high test coverage and supreme product quality. Within this project, based on the fault simulation with Defect Oriented Test (DOT) technique, the current tests with the most efficient coverage improvements have been selected and implemented in the production testing flow.