Thermal acceleration of compound semiconductors in humidity

Abstract

Purpose Product reliability investigations typically include accelerated humidity testing. Originally, the "standard" test was a biased 8501/85% Relative Humidity (RH) lifetest for 1000 hours. Recently, a substitute accelerated version of this test has been used. The accelerated version is called HAST (Highly Accelerated Stress Test). The HAST conditions are also biased, at 1300C, 85%°RH, and approximately 18 PSI overpressure. The duration of the HAST test is normally 96100 hours to be equivalent to the 85/85 testtY1 This study is intended to investigate thermal acceleration and show that equivalent HAST tests on Compound Semiconductors are more highly accelerated and could be conducted much faster.