{"title":"Automatic generation of a single-chip solution for board-level BIST of boundary scan boards","authors":"J. Ferreira, J. S. Matos, F. S. Pinto","doi":"10.1109/EDAC.1992.205913","DOIUrl":null,"url":null,"abstract":"The automatic generation of a hierarchical self-test architecture for boards with boundary scan test (BST) is described, based on a test processor specifically designed to implement the basic operations required to control the BST infrastructure. An ATPG module generates the ROM containing the test program, allowing a single-chip self-test solution with minimal design-for-testability overhead. The same test processor may be used without internal ROM, when a single-chip solution is not desirable.<<ETX>>","PeriodicalId":285019,"journal":{"name":"[1992] Proceedings The European Conference on Design Automation","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-03-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1992] Proceedings The European Conference on Design Automation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EDAC.1992.205913","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
The automatic generation of a hierarchical self-test architecture for boards with boundary scan test (BST) is described, based on a test processor specifically designed to implement the basic operations required to control the BST infrastructure. An ATPG module generates the ROM containing the test program, allowing a single-chip self-test solution with minimal design-for-testability overhead. The same test processor may be used without internal ROM, when a single-chip solution is not desirable.<>