Production challenges of TSOP Copper wire bonding

K. Loh, Y. Pan, C. E. Tan
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引用次数: 1

Abstract

With the Copper wire bonding already occupying majority of production lines, there are many significant factors continue to surface out. The Copper wire bonding has also becomes very susceptible to production variability of small leaded packages such as Thin Small Outline Package (TSOP). The TSOP utilizes thin and flimsy leadframes, causing a lot challenges at 2nd bond (stitch). The stitch bonding shows high occurrences of pre-mature failures or wire breaks, while struggling to maintain good stitch bonding strength. Furthermore, the inconsistent stitch bonding can also cause inconsistent tail formation, subsequently affecting the formation of Free Air Ball (FAB) and 1st bond quality. With many DOEs (Design of Experiments), several improvements were executed to address the stitch forming issues. Some of these major actions include optimizing several parameters such as the 2nd bond force, wire looping speed, wire loop mode change and wire sequencing. However, even with the implementation of these improvement actions, the Copper wire bonding performance was only improved by 50%. More comprehensive mapping was extended into possible impact of leadframe location and design. Surprisingly, die attach process was found to be the confounding with the leadframe design. It looks like wire stitch formation at ground lead is not consistent, mostly affected by the die attach epoxy bleed and outgas. In order to obtain more robust Copper wire bonding performance, the die attach process was optimized accordingly. Without losing any die attach quality, optimized process provided much larger operating margin for Copper wire bonding. All the combined improvements managed to eliminate wire break occurrence, while maintaining the good bonding strength of 1st and 2nd bonds. The lessons learnt were very important and already embedded to all new Copper wire bonding projects in order to realize 1st pass success into production mode.
TSOP铜线粘接的生产挑战
随着铜线粘接已经占据了大部分生产线,有许多重要的因素继续浮出水面。铜线粘合也变得非常容易受到小型含铅封装(如细小轮廓封装(TSOP))的生产变化的影响。TSOP采用薄而脆弱的引线框架,在第二键(针)造成很多挑战。在保持良好的缝接强度的同时,缝接出现了高的早熟故障或断线现象。此外,针迹粘合不一致也会导致尾形不一致,从而影响自由空气球(FAB)的形成和第一次粘合质量。与许多do(实验设计),几个改进被执行,以解决针迹形成问题。其中一些主要的动作包括优化几个参数,如第二键力、导线环速度、导线环模式改变和导线排序。然而,即使实施了这些改进措施,铜线的粘合性能也只提高了50%。更全面的映射扩展到引线框位置和设计的可能影响。令人惊讶的是,模具附加工艺被发现是与引线框架设计的混淆。看起来线迹形成在地面引线是不一致的,主要是受模具附着环氧出血和排气的影响。为了获得更坚固的铜丝粘接性能,对模具贴接工艺进行了相应的优化。优化后的工艺在不影响模具贴接质量的前提下,为铜线粘接提供了更大的操作空间。所有这些综合改进都设法消除了断线的发生,同时保持了第一键和第二键的良好结合强度。吸取的经验教训非常重要,并且已经嵌入到所有新的铜线粘接项目中,以实现第一次成功进入生产模式。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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