The advantage of Slow Cure NCP in filp chip package

Yoshihide Fukuhara, M. Hoshiyama, Toshikazu Hocchi, Y. Kamata, Hirotatsu Ikarashi, Ruka Iwaya
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引用次数: 0

Abstract

Smaller flip chip packages have been developing and narrow gap and small pitch are required. The capillary type underfill still mainly applies for the flip chip mass-production process. The Non-Conductive Past (NCP), which is applied before chip attachment, has been introduced for fine pitch applications. These pre-applied type underfill have some advantages, such as no free space for dispensing and no flux cleaning process. However, the NCP has issue for connectivity and void control. We develop the new NCP, which is named Slow Cure NCP (SCNCP), to improve the connectivity and void control. SCNCP has slow cure ability to be void free after a pressure oven cure. It leads to an easier void controlling. In addition, slow cure property makes solder wettability higher and achieves better joint shape.
慢固化NCP在芯片封装中的优势
更小的倒装芯片封装一直在发展,需要更窄的间隙和更小的间距。毛细管式底充填主要应用于倒装芯片的量产工艺。非导电过去(NCP),在芯片附着之前应用,已被引入到小间距应用中。这些预涂式底填料有一些优点,如没有自由的空间分配和没有助焊剂清洗过程。然而,NCP在连通性和无效控制方面存在问题。我们开发了新的NCP,它被命名为慢治愈NCP (SCNCP),以改善连通性和空洞控制。经压力炉固化后,SCNCP具有缓慢固化能力,无空隙。这会让你更容易控制空虚。此外,慢固化性能使焊料润湿性更高,获得更好的接头形状。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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