D. Mannath, D. Webster, V. Montaño-Martinez, David Cohen, S. Kush, G. Thiagarajan, A. Sontakke
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引用次数: 24
Abstract
Production testing of today's RF SoCs does not require expensive conventional tests. We propose a set of defect based tests for the RF/Analog sections, based on our analysis of defects that occur in a modern RFCMOS process.
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