{"title":"Transient simulation of solder joint fracturing under impact test","authors":"Chang-Lin Yen, Y. Lai","doi":"10.1109/EPTC.2004.1396696","DOIUrl":null,"url":null,"abstract":"In this paper, transient deformation and fracturing of solder joints subjected to the impact load are investigated numerically. The three-dimensional finite element analysis applies the explicit time integration scheme and incorporates as well contact, fracturing and fragmentation mechanisms to predict the transient response and the failure mode of the solder joint subjected to an impact load.","PeriodicalId":370907,"journal":{"name":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2004.1396696","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21
Abstract
In this paper, transient deformation and fracturing of solder joints subjected to the impact load are investigated numerically. The three-dimensional finite element analysis applies the explicit time integration scheme and incorporates as well contact, fracturing and fragmentation mechanisms to predict the transient response and the failure mode of the solder joint subjected to an impact load.