Studies on the transitional behaviors of Au-to-Au micro-contact during the initialization stage of contact formation under low contact force

H. Qiu, Hong Wang, F. Ke
{"title":"Studies on the transitional behaviors of Au-to-Au micro-contact during the initialization stage of contact formation under low contact force","authors":"H. Qiu, Hong Wang, F. Ke","doi":"10.1109/ESIME.2012.6191804","DOIUrl":null,"url":null,"abstract":"In nowadays, ohmic-contact MEMS switches have been widely studied due to their variously advantages, such as high isolation, low insertion loss, negligible power consumption and so on. The micro-contact behavior has been analyzed by several researchers using the conventional asperity deformation model, in which the electrical contact resistance decreases gradually with increasing contact force and finally reaches a saturation region. This paper presents a study of the instable region of micro-contact behaviors under low contact force and low current conditions, where the conventional model does not seems to be applicable. Random telegraph signals (RTS) were captured during the transition period before the establishment of stable electrical contact. An electrothermal approach was applied in our work and the time constants of the RTS during instable region are extracted statistically from the experimental data. The fundamental mechanism for the contact resistance instabilities were discussed under the framework of material transfer enhanced by localized Joule heating.","PeriodicalId":319207,"journal":{"name":"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2012.6191804","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

In nowadays, ohmic-contact MEMS switches have been widely studied due to their variously advantages, such as high isolation, low insertion loss, negligible power consumption and so on. The micro-contact behavior has been analyzed by several researchers using the conventional asperity deformation model, in which the electrical contact resistance decreases gradually with increasing contact force and finally reaches a saturation region. This paper presents a study of the instable region of micro-contact behaviors under low contact force and low current conditions, where the conventional model does not seems to be applicable. Random telegraph signals (RTS) were captured during the transition period before the establishment of stable electrical contact. An electrothermal approach was applied in our work and the time constants of the RTS during instable region are extracted statistically from the experimental data. The fundamental mechanism for the contact resistance instabilities were discussed under the framework of material transfer enhanced by localized Joule heating.
低接触力条件下au - au微接触形成初始阶段过渡行为研究
目前,欧姆接触MEMS开关由于具有高隔离性、低插入损耗、可忽略功耗等优点而受到广泛的研究。多名研究人员利用传统的粗糙变形模型分析了微接触行为,其中接触电阻随着接触力的增大而逐渐减小,最终达到饱和区域。本文研究了低接触力和低电流条件下微接触行为的不稳定区域,在此情况下,传统模型似乎不适用。在稳定电接触建立之前的过渡期间捕获随机电报信号(RTS)。我们的工作采用了电热方法,并从实验数据中统计提取了RTS在不稳定区域的时间常数。在局部焦耳加热增强材料传递的框架下,讨论了接触电阻不稳定的基本机理。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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