Silicon-based quantum computing: manufacturing and metrology challenges (Conference Presentation)

R. Silver
{"title":"Silicon-based quantum computing: manufacturing and metrology challenges (Conference Presentation)","authors":"R. Silver","doi":"10.1117/12.2517365","DOIUrl":null,"url":null,"abstract":"Over the last 20 years there has been a steady increase in fundamental physics research and the hardware development needed to realize a quantum computer. However, in the last 5 years we have seen a dramatic increase in the interest from industry, including a variety of major semiconductor and technology leaders such as IBM, Google and Intel. This is the result of both a better understanding of the variety of problems that can be addressed and the impact that will come with quantum computing along with the emergence of a couple of potentially scalable hardware solutions. In a recent interview with a leading manufacturer, an aggressive strategy was laid out to achieve an operational 1000-qubit quantum computer within 5 years that can solve a variety of problems not addressable by conventional computing and the 10-year prospect to achieve a 1 million qubit machine that would “profoundly change society”. \n\nThe major technology leaders view quantum information (QI) as a technology that they must begin to develop and understand today. Augmenting existing technology with QI is desirable, but , there are a variety of technical challenges to making silicon-based QI systems with the needed quantum properties and coherence times. New challenges in atomic precision and individual atom or electron effects that fundamentally affect device performance bring on a variety of new manufacturing and metrology challenges. Measuring electron spin coherence, exchange energies, and qubit fidelity are entirely new measurements for the semiconductor industry. Even the resolution of TEM may be inadequate, as TEM of a nominally 80 nm thick slice of silicon which averages many atoms together in a measurement where only one or two atoms can deeply change device performance, coherence times, or introduce charge offsets. After developing some of the first cold atom and ion trap quantum information demonstrations at NIST, we are now investing significantly in developing the supporting metrology and modeling methods needed to help industry develop and commercialize this new technology.\n\nIn this presentation we will provide an overview of hardware solutions for quantum computing, future metrology needs and challenges to enable manufacturable quantum computers. Although industry leaders are now investing in superconducting qubits and silicon-based qubits, the two leading technologies, this talk will primarily focus on the principles of solid state silicon QI operation, manufacturing metrology solutions, and measurements needed to develop and evaluate viable technological solutions.","PeriodicalId":331248,"journal":{"name":"Metrology, Inspection, and Process Control for Microlithography XXXIII","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Metrology, Inspection, and Process Control for Microlithography XXXIII","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2517365","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Over the last 20 years there has been a steady increase in fundamental physics research and the hardware development needed to realize a quantum computer. However, in the last 5 years we have seen a dramatic increase in the interest from industry, including a variety of major semiconductor and technology leaders such as IBM, Google and Intel. This is the result of both a better understanding of the variety of problems that can be addressed and the impact that will come with quantum computing along with the emergence of a couple of potentially scalable hardware solutions. In a recent interview with a leading manufacturer, an aggressive strategy was laid out to achieve an operational 1000-qubit quantum computer within 5 years that can solve a variety of problems not addressable by conventional computing and the 10-year prospect to achieve a 1 million qubit machine that would “profoundly change society”. The major technology leaders view quantum information (QI) as a technology that they must begin to develop and understand today. Augmenting existing technology with QI is desirable, but , there are a variety of technical challenges to making silicon-based QI systems with the needed quantum properties and coherence times. New challenges in atomic precision and individual atom or electron effects that fundamentally affect device performance bring on a variety of new manufacturing and metrology challenges. Measuring electron spin coherence, exchange energies, and qubit fidelity are entirely new measurements for the semiconductor industry. Even the resolution of TEM may be inadequate, as TEM of a nominally 80 nm thick slice of silicon which averages many atoms together in a measurement where only one or two atoms can deeply change device performance, coherence times, or introduce charge offsets. After developing some of the first cold atom and ion trap quantum information demonstrations at NIST, we are now investing significantly in developing the supporting metrology and modeling methods needed to help industry develop and commercialize this new technology. In this presentation we will provide an overview of hardware solutions for quantum computing, future metrology needs and challenges to enable manufacturable quantum computers. Although industry leaders are now investing in superconducting qubits and silicon-based qubits, the two leading technologies, this talk will primarily focus on the principles of solid state silicon QI operation, manufacturing metrology solutions, and measurements needed to develop and evaluate viable technological solutions.
硅基量子计算:制造和计量挑战(会议报告)
在过去的20年里,基础物理研究和实现量子计算机所需的硬件开发一直在稳步增长。然而,在过去的5年里,我们看到了来自工业界的兴趣急剧增加,包括各种主要的半导体和技术领导者,如IBM、谷歌和英特尔。这是对可以解决的各种问题的更好理解以及量子计算将带来的影响以及几个潜在的可扩展硬件解决方案的出现的结果。在最近对一家领先制造商的采访中,他们提出了一项激进的战略,即在5年内实现可运行的1000量子位量子计算机,可以解决传统计算无法解决的各种问题,并在10年内实现100万量子位机器,这将“深刻改变社会”。主要的技术领导者将量子信息(QI)视为他们今天必须开始开发和理解的技术。用QI增强现有技术是可取的,但是,要使基于硅的QI系统具有所需的量子特性和相干时间,存在各种技术挑战。原子精度和单个原子或电子效应的新挑战从根本上影响设备性能,带来了各种新的制造和计量挑战。测量电子自旋相干性、交换能和量子比特保真度对半导体工业来说是全新的测量方法。即使是TEM的分辨率也可能是不够的,因为名义上80纳米厚的硅片的TEM在测量中将许多原子平均在一起,而只有一个或两个原子可以深刻地改变器件性能,相干时间或引入电荷偏移。在NIST开发了第一批冷原子和离子阱量子信息演示之后,我们现在正在大力投资开发支持计量和建模方法,以帮助工业开发和商业化这项新技术。在本次演讲中,我们将概述量子计算的硬件解决方案,未来的计量需求和挑战,以实现可制造的量子计算机。尽管行业领导者现在正在投资超导量子比特和硅基量子比特这两种领先技术,但本次演讲将主要关注固态硅QI操作的原理,制造计量解决方案,以及开发和评估可行技术解决方案所需的测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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