{"title":"Oscillator Devices Using Thick-Film Technology","authors":"J. Williams","doi":"10.1109/TPHP.1977.1135173","DOIUrl":null,"url":null,"abstract":"The Electrical Engineering Department of North Carolina Agricultural and Technical State University has developed a microelectronics laboratory as a result of research involving microelectronics and metallic oxide studies over the past five years. Work on characterization and applications of metallic oxide devices is currently being conducted. This paper reports on the fabrication of eight oscillator devices on a l-in square alumina substrate using metallic oxide materials developed at NC A&T State University as a result of the research program. Significant technological capabilities of the laboratory relative to the microelectronics industry in the area of microelectronic component evaluation is also discussed.","PeriodicalId":387212,"journal":{"name":"IEEE Transactions on Parts, Hybrids, and Packaging","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1977-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Parts, Hybrids, and Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TPHP.1977.1135173","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The Electrical Engineering Department of North Carolina Agricultural and Technical State University has developed a microelectronics laboratory as a result of research involving microelectronics and metallic oxide studies over the past five years. Work on characterization and applications of metallic oxide devices is currently being conducted. This paper reports on the fabrication of eight oscillator devices on a l-in square alumina substrate using metallic oxide materials developed at NC A&T State University as a result of the research program. Significant technological capabilities of the laboratory relative to the microelectronics industry in the area of microelectronic component evaluation is also discussed.