Micro devices integration with large-area 2D chip-network using stretchable electroplating copper spring

W. Sung, W. Lai, Chih-Chung Chen, Kevin Huang, W. Fang
{"title":"Micro devices integration with large-area 2D chip-network using stretchable electroplating copper spring","authors":"W. Sung, W. Lai, Chih-Chung Chen, Kevin Huang, W. Fang","doi":"10.1109/MEMSYS.2014.6765846","DOIUrl":null,"url":null,"abstract":"This study presents a large-area multi-devices integration scheme using stretchable electroplated copper spring. Each device is located on the silicon-node of a 2D chip-network distributed, which are mechanically and electrically connected to surrounding devices by stretchable copper spring. The springs stretch and expand the functional devices by several orders of magnitude area forming a variable-density network of interconnected devices. Advantages of this approach include: (1) using existing process technologies and materials for semiconductor in large-area applications, compatible with foundry fabrication processes; (2) stretchable electroplated copper springs with large maximum strain act as both mechanical and electrical connections between devices; (3) silicon-nodes act as hubs for device implementation and integration; and (4) the chip-network can be applied to 2D-curved (spherical) surfaces. The proposed expandable network using stretchable springs integrated with multiple devices has been implemented and tested.","PeriodicalId":312056,"journal":{"name":"2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-03-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE 27th International Conference on Micro Electro Mechanical Systems (MEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MEMSYS.2014.6765846","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

This study presents a large-area multi-devices integration scheme using stretchable electroplated copper spring. Each device is located on the silicon-node of a 2D chip-network distributed, which are mechanically and electrically connected to surrounding devices by stretchable copper spring. The springs stretch and expand the functional devices by several orders of magnitude area forming a variable-density network of interconnected devices. Advantages of this approach include: (1) using existing process technologies and materials for semiconductor in large-area applications, compatible with foundry fabrication processes; (2) stretchable electroplated copper springs with large maximum strain act as both mechanical and electrical connections between devices; (3) silicon-nodes act as hubs for device implementation and integration; and (4) the chip-network can be applied to 2D-curved (spherical) surfaces. The proposed expandable network using stretchable springs integrated with multiple devices has been implemented and tested.
微器件集成与大面积二维芯片网络采用可拉伸电镀铜弹簧
提出了一种采用可拉伸电镀铜弹簧的大面积多器件集成方案。每个设备位于二维芯片网络分布的硅节点上,通过可拉伸的铜弹簧与周围设备机械和电气连接。弹簧通过几个数量级的面积拉伸和扩展功能装置,形成一个可变密度的互连装置网络。这种方法的优点包括:(1)在大面积应用中使用现有的半导体工艺技术和材料,与铸造制造工艺兼容;(2)可拉伸电镀铜弹簧,最大应变大,可作为设备之间的机械和电气连接;(3)硅节点作为设备实现和集成的枢纽;(4)芯片网络可应用于二维曲面(球面)。所提出的可扩展网络采用可伸缩弹簧与多个设备集成,并已实施和测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信