Spice-based performance analysis of ultra-low voltage Si nanowire CMOS circuits

C. Tanaka, M. Saitoh, K. Ota, K. Uchida, T. Numata
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引用次数: 2

Abstract

An ultra-low voltage performance of nanowire-transistors-based CMOS circuits is investigated using the Spice model parameters. All Spice model parameters of BSIM4 are extracted from measurement data of nanowire transistors fabricated on 300 mm SOI wafer. The delay time and the power consumption of NW-Tr.-based and bulk-Tr.-based CMOS circuits are examined. The operation voltage of NW-Tr.-based inverter is reduced 300 mV smaller than that of bulk-Tr.-based inverter due to the ideal sub-threshold slope. The performance benefits of NW-Tr.-based stacked circuit and SRAM cell are measured in terms of ultra-low voltage and ultra-low power operation.
基于香料的超低电压硅纳米线CMOS电路性能分析
利用Spice模型参数研究了基于纳米线晶体管的CMOS电路的超低电压性能。BSIM4的所有Spice模型参数均提取自300 mm SOI晶圆上纳米线晶体管的测量数据。NW-Tr的延时时间和功耗。基于和bulk-Tr。的CMOS电路进行了测试。NW-Tr的工作电压。的逆变器比bulk-Tr减小了300 mV。基于逆变器的理想亚阈值斜率。NW-Tr的性能优势。基于堆叠电路和SRAM单元的超低电压和超低功耗工作进行了测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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