Comparative Study of Sm and La Doped ZnO Properties

I. V. Tudose, P. Pascariu, C. Pachiu, F. Comanescu, M. Danila, R. Gavrila, E. Koudoumas, Mirela Petruta Suchea
{"title":"Comparative Study of Sm and La Doped ZnO Properties","authors":"I. V. Tudose, P. Pascariu, C. Pachiu, F. Comanescu, M. Danila, R. Gavrila, E. Koudoumas, Mirela Petruta Suchea","doi":"10.1109/SMICND.2018.8539807","DOIUrl":null,"url":null,"abstract":"Samarium and Lanthanum doped nanostructured ZnO thin films were grown onto glass substrates by spray deposition method. Influences of different concentrations (0% to 1%) of Sm and La on the ZnO structural and optical properties were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD), atomic force microscopy (AFM), Raman spectroscopy and by UV-VIS spectroscopy. X-ray diffraction studies revealed that the ZnO films have zincite crystalline structure and show a preferential growth orientation along (101) crystallographic orientation. Doping with Sm and La leads to changes of thin films crystallinity as well as their transparency in VIS region of electromagnetic spectrum. Increasing dopant concentration leads to slightly increased transparency.","PeriodicalId":247062,"journal":{"name":"2018 International Semiconductor Conference (CAS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Semiconductor Conference (CAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMICND.2018.8539807","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Samarium and Lanthanum doped nanostructured ZnO thin films were grown onto glass substrates by spray deposition method. Influences of different concentrations (0% to 1%) of Sm and La on the ZnO structural and optical properties were investigated by scanning electron microscopy (SEM), X-ray diffraction (XRD), atomic force microscopy (AFM), Raman spectroscopy and by UV-VIS spectroscopy. X-ray diffraction studies revealed that the ZnO films have zincite crystalline structure and show a preferential growth orientation along (101) crystallographic orientation. Doping with Sm and La leads to changes of thin films crystallinity as well as their transparency in VIS region of electromagnetic spectrum. Increasing dopant concentration leads to slightly increased transparency.
Sm和La掺杂ZnO性能的比较研究
采用喷雾沉积法在玻璃衬底上生长了掺杂钐和镧的纳米ZnO薄膜。采用扫描电镜(SEM)、x射线衍射(XRD)、原子力显微镜(AFM)、拉曼光谱(Raman spectroscopy)和紫外可见光谱(UV-VIS spectroscopy)研究了不同浓度(0% ~ 1%)Sm和La对ZnO结构和光学性能的影响。x射线衍射研究表明,ZnO薄膜具有锌矿晶体结构,并表现出沿(101)晶体取向的优先生长方向。Sm和La的掺入改变了薄膜的结晶度和电磁波谱VIS区的透明度。随着掺杂剂浓度的增加,透明度略有增加。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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