The influence of the package environment on the functioning and reliability of RF-MEMS switches

W. M. van Spengen, P. Czarnecki, R. Puers, J. V. van Beek, I. De Wolf
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引用次数: 24

Abstract

This paper discusses the influence of pressure and gas inside a package on the functioning and lifetime of capacitive RF-MEMS switches. It is shown that decreasing the pressure strongly influences the switching speed of a switch, but if it becomes too low it causes anomalous vibration effects. When testing at the same pressure, it is shown that the lifetime of the capacitive switches is higher in a nitrogen environment than in ambient air (lab) environment. These effects are attributed to the humidity of the air and its influence on charge trapping in the insulator, resulting in stiction of the switch bridge. It is also shown that this charge is not stable and that the switch recovers when it is not actuated.
封装环境对RF-MEMS开关功能和可靠性的影响
本文讨论了封装内压力和气体对电容式RF-MEMS开关功能和寿命的影响。结果表明,降低压力对开关的开关速度有较大影响,但压力过低则会引起异常振动效应。在相同压力下测试时,结果表明,电容开关在氮气环境中的寿命比在环境空气(实验室)环境中的寿命要高。这些影响归因于空气的湿度及其对绝缘体中电荷捕获的影响,从而导致开关桥的粘连。结果还表明,该电荷是不稳定的,当开关不被驱动时,开关会恢复。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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