Review on induced CDM-ESD test methodologies for flash memory device

Abstract

During CDM-ESD test, misalignment may occur between the discharge pin and the DUT terminal, especially when the package size shrinks down. We investigated the effect of top ball touch (non-misaligned) and side ball touch (misaligned) on the electrical characteristics of memory devices. The experimental data were analyzed using statistical hypothesis tests and supported by the physics theory of Gauss' Law. We also studied the impact of Mylar dielectric film on the device performance.