FACTS: fault coverage estimation by test vector sampling

Abstract

We propose a new statistical technique for estimating fault coverage in combinational circuits. Our method requires fault-free simulation of a random sample of vectors from the test vector set. Fault coverage is computed from controlabilities and observabilities both defined as probabilities and the method is applicable to any fault model like stuck-at-faults or delay faults. Experimental results are presented for path and transition delay faults.<>