Two improved methods for testing ADC parametric faults by digital input signals

Abstract

In this paper, two improved methods are presented extending our previous work. The first one improves the results by adjusting the voltage levels of the input pulse wave stimulus. Compared with the sine wave input stimulus, the four-level pulse wave can detect even more faulty cases with the offset faults. The second one improves the results by calculating the similarity of the output spectra between the golden devices and the DUTs. Compared with the previous method [10], it is less sensitive to the jitter and the change of the rise/fall time of the input pulse wave stimulus. In these two methods, a number of golden devices are tested at first to obtain the fault-free range. At last, a signature result is obtained from both methods. It can filter out the faulty devices in a quick way before testing the specific values of the conventional dynamic and static parameters.