A functional BIST approach for FIR digital filters

Digest of Papers. 1992 IEEE VLSI Test Symposium Pub Date : 1992-04-07 DOI:10.1109/VTEST.1992.232730

C. Counil, G. Cambon

引用次数: 11

Abstract

Presents a functional level built-in self-test of digital filters. This BIST technique is based on predetermined patterns which are not dependent on the filter implementation. Many examples show that stuck-at fault coverage is about 98%.<>

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FIR数字滤波器的功能BIST方法

提出了一种功能级的数字滤波器内置自检方法。这种BIST技术基于不依赖于过滤器实现的预定模式。许多例子表明，卡在故障的覆盖率约为98%

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Digest of Papers. 1992 IEEE VLSI Test Symposium

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