D. Wolf, A. Jourdain, P. de Moor, H. Tilmans, L. Marchand
{"title":"Hermeticity Testing and Failure Analysis of MEMS Packages","authors":"D. Wolf, A. Jourdain, P. de Moor, H. Tilmans, L. Marchand","doi":"10.1109/IPFA.2007.4378075","DOIUrl":null,"url":null,"abstract":"Several microsystem applications require hermetic or semi- hermetic packages. It is for this reason mandatory to be able to check the hermeticity of these packages. The standard tests, using gross leak and fine leak, work very well for large cavities, but might give erroneous results for small cavities as typically used for MEMS. We discussed different alternative test methods.","PeriodicalId":334987,"journal":{"name":"2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2007.4378075","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20
Abstract
Several microsystem applications require hermetic or semi- hermetic packages. It is for this reason mandatory to be able to check the hermeticity of these packages. The standard tests, using gross leak and fine leak, work very well for large cavities, but might give erroneous results for small cavities as typically used for MEMS. We discussed different alternative test methods.