{"title":"Reflection de-embedding for high-speed I/O measurements","authors":"Sunil R. Sudhakaran, Daniel Lin","doi":"10.1109/EPEPS.2016.7835435","DOIUrl":null,"url":null,"abstract":"Reflections in high-speed busses can corrupt signal measurements when the probe location is away from the DUT. This paper presents a methodology to remove such reflections. A mathematical formulation of the problem is presented along with solutions to commonly encountered topologies.","PeriodicalId":241629,"journal":{"name":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","volume":"158 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 25th Conference on Electrical Performance Of Electronic Packaging And Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2016.7835435","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Reflections in high-speed busses can corrupt signal measurements when the probe location is away from the DUT. This paper presents a methodology to remove such reflections. A mathematical formulation of the problem is presented along with solutions to commonly encountered topologies.