{"title":"Composite electro-optical testing of surface-mount device boards-one manufacturer's experience","authors":"F. J. Langley, Ronald R. Boatright, L. Crosby","doi":"10.1109/TEST.1989.82356","DOIUrl":null,"url":null,"abstract":"The use of surface-mount devices (SMDs) in the US manufacture of high-quality switchboards presented the need to reduce cost, while maintaining traditional quality and reliability, and without decreasing throughput or adding process steps. Further, the complexity of the display panels demanded a completely automatic test solution without the operator in the loop. The authors describe the use of automatic optical inspection in conjunction with electrical testing for a medium-volume manufacturing situation. The effectiveness of this test solution in meeting the needs of a major change in device technology is quantified from measurement accuracy and consistency viewpoints. Increased production efficiency as compared with previous tests strategies is indicated.<<ETX>>","PeriodicalId":264111,"journal":{"name":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1989.82356","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The use of surface-mount devices (SMDs) in the US manufacture of high-quality switchboards presented the need to reduce cost, while maintaining traditional quality and reliability, and without decreasing throughput or adding process steps. Further, the complexity of the display panels demanded a completely automatic test solution without the operator in the loop. The authors describe the use of automatic optical inspection in conjunction with electrical testing for a medium-volume manufacturing situation. The effectiveness of this test solution in meeting the needs of a major change in device technology is quantified from measurement accuracy and consistency viewpoints. Increased production efficiency as compared with previous tests strategies is indicated.<>