Mario Gonzalez, F. Axisa, F. Bossuyt, Yung-Yu Hsu, Bart Vandevelde, J. Vanfleteren
{"title":"Design and performance of metal conductors for stretchable electronic circuits","authors":"Mario Gonzalez, F. Axisa, F. Bossuyt, Yung-Yu Hsu, Bart Vandevelde, J. Vanfleteren","doi":"10.1108/03056120910928699","DOIUrl":null,"url":null,"abstract":"In this paper we review the mechanical properties and reliability results of stretchable interconnections used for electronic applications. These interconnections were produced by a Moulded Interconnect Device (MID) technology in which a specially designed metal interconnection if fully embedded with an elastic material such as polyurethane or silicone. In order to get a first impression of the expected damage in the interconnections, this research employs Finite Element Modelling (FEM) to analyse the physical behaviour of stretchable interconnects under different loading conditions. Moreover, the fatigue life of a copper interconnect embedded into a silicone matrix has been evaluated using the Coffin-Manson relation and FEM.","PeriodicalId":146584,"journal":{"name":"2008 2nd Electronics System-Integration Technology Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-11-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"74","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 2nd Electronics System-Integration Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1108/03056120910928699","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 74
Abstract
In this paper we review the mechanical properties and reliability results of stretchable interconnections used for electronic applications. These interconnections were produced by a Moulded Interconnect Device (MID) technology in which a specially designed metal interconnection if fully embedded with an elastic material such as polyurethane or silicone. In order to get a first impression of the expected damage in the interconnections, this research employs Finite Element Modelling (FEM) to analyse the physical behaviour of stretchable interconnects under different loading conditions. Moreover, the fatigue life of a copper interconnect embedded into a silicone matrix has been evaluated using the Coffin-Manson relation and FEM.