Nonlinear dynamic behavior of thin PCB board for solder joint reliability study under shock loading

L. W. Keat, Lee Yung Hsiang, Ajay Munigayah, Taylor We
{"title":"Nonlinear dynamic behavior of thin PCB board for solder joint reliability study under shock loading","authors":"L. W. Keat, Lee Yung Hsiang, Ajay Munigayah, Taylor We","doi":"10.1109/EMAP.2005.1598274","DOIUrl":null,"url":null,"abstract":"Solder joint reliability under shock loading condition has been a concern over the years especially with constant reductions in the characteristic dimensions of the package and the solder joint. With the impeding transition to lead free solder, attention has moved from temperature cycle failure to mechanical shock failure. A method has been developed that employs a specially designed shock test board (STB) to characterize the solder joint performance as a function of board surface strain. This unique test board can be adapted to a wide range of test and boundary conditions. Using this board, a range of shock inputs is tested to establish correlation of the dynamic response and solder joint damage severity. This method can be used to characterize solder joint performance at the component level, early in development. One can also provide board strain based design limits guide system design and prevent late discovery of solder joint issues. Modal analysis based and explicit time integration finite element models have been used to supplement understanding of the board response after shock loading. The shock model demonstrates good correlation of the strain on the thick board while thin board shows challenges in modeling prediction where nonlinear behavior observed. The modeling data also suggested that the maximum principal stress at the solder joint interface is a good failure criterion as it maps well with the actual failure region found.","PeriodicalId":352550,"journal":{"name":"2005 International Symposium on Electronics Materials and Packaging","volume":"78 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-12-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Symposium on Electronics Materials and Packaging","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMAP.2005.1598274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7

Abstract

Solder joint reliability under shock loading condition has been a concern over the years especially with constant reductions in the characteristic dimensions of the package and the solder joint. With the impeding transition to lead free solder, attention has moved from temperature cycle failure to mechanical shock failure. A method has been developed that employs a specially designed shock test board (STB) to characterize the solder joint performance as a function of board surface strain. This unique test board can be adapted to a wide range of test and boundary conditions. Using this board, a range of shock inputs is tested to establish correlation of the dynamic response and solder joint damage severity. This method can be used to characterize solder joint performance at the component level, early in development. One can also provide board strain based design limits guide system design and prevent late discovery of solder joint issues. Modal analysis based and explicit time integration finite element models have been used to supplement understanding of the board response after shock loading. The shock model demonstrates good correlation of the strain on the thick board while thin board shows challenges in modeling prediction where nonlinear behavior observed. The modeling data also suggested that the maximum principal stress at the solder joint interface is a good failure criterion as it maps well with the actual failure region found.
冲击载荷下薄PCB板焊接可靠性非线性动态行为研究
多年来,特别是随着封装和焊点特征尺寸的不断减小,冲击载荷条件下的焊点可靠性一直是一个值得关注的问题。随着向无铅焊料过渡的阻碍,人们的注意力已经从温度循环故障转移到机械冲击故障。一种采用特殊设计的冲击试验板(STB)来表征焊点性能作为板表面应变函数的方法已经开发出来。这种独特的测试板可以适应广泛的测试和边界条件。使用该板,测试了一系列冲击输入,以建立动态响应和焊点损伤严重程度的相关性。该方法可用于在开发早期在组件级表征焊点性能。还可以提供基于板应变的设计限制指导系统设计,并防止后期发现焊点问题。基于模态分析和显式时间积分的有限元模型已被用于补充对冲击载荷后板响应的理解。冲击模型显示了厚板应变的良好相关性,而薄板在观察到非线性行为的建模预测方面存在挑战。模拟数据还表明,在焊点界面处的最大主应力是一个很好的失效准则,因为它与实际发现的失效区域很好地映射。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信