Chipping free process for combination of narrow saw street (60um) and thick wafer (600um) sawing process

Mohd Amri, David Liew, F. Harun
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引用次数: 13

Abstract

Chipping free is a dream for wafer sawing process. With current high complexity of wafer technology plus the drive for cost reduction by narrowing the saw street width, it is a challenge which requires huge effort for wafer sawing process to achieve chipping free process. Higher density of metallization causing higher blade loading during mechanical sawing. This leads to chipping penetrating under the guard ring and damaging the active area. This paper will share all the activities towards chipping free process on a device involving optimization through mechanical sawing, infra red camera and laser grooving process. Blade selection involving various diamond grit size, different concentration, slit design and low k types only able to minimize the occurrence but not totally eliminate it. Finally by performing laser grooving, significant results were achieved with zero chipping occurrences. In addition, suitable laser frequency selection is also important to ensure the best performance. In this case higher frequency laser grooving in combination with mechanical sawing process found to be able to meet the requirement.
窄锯街(60um)和厚片(600um)锯切工艺相结合的无屑工艺
无屑是圆片锯切工艺的梦想。随着目前晶圆技术的高度复杂性,加上对降低成本的驱动,通过缩小锯路宽度来实现晶圆锯切过程的无屑是一个挑战,需要付出巨大的努力。较高的金属化密度导致机械锯切过程中较高的叶片负荷。这导致碎屑穿透保护环和破坏活动区域。本文将分享通过机械锯切、红外摄像和激光开槽工艺对设备进行优化的所有活动。涉及不同金刚石粒度、不同浓度、狭缝设计和低k型的刀片选择只能使其发生最小化,而不能完全消除。最后,通过进行激光刻槽,取得了显著的结果,零切屑发生。此外,合适的激光频率选择对于确保最佳性能也很重要。在这种情况下,高频激光开槽结合机械锯切工艺可以满足要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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