Experimental and numerical investigation on warpage of QFN packages induced during the array molding process

D.G. Yang, K. Jansen, L. Ernst, Zhang Gq, J. Beijer, J. Janssen
{"title":"Experimental and numerical investigation on warpage of QFN packages induced during the array molding process","authors":"D.G. Yang, K. Jansen, L. Ernst, Zhang Gq, J. Beijer, J. Janssen","doi":"10.1109/ICEPT.2005.1564637","DOIUrl":null,"url":null,"abstract":"An investigation on the process-induced warpage during the array-molding process of QFN packages was conducted both experimentally and numerically. A series of molding experiments for QFN matrix strips with the model-molding compounds were performed. In the molding experiments, different processing parameters, filler loading and die thickness were used. The warpage was measured by a contact probe coordinate measuring system. A cure-dependent constitutive model for the encapsulating EMC was applied to describe the behavior of the material during the curing process. The cure-dependent material parameters were incorporated into a finite element code MARC and numerical simulations were carried out for the QFN array-molding process. The effects of filler percentage of the molding compound, the curing temperature profiles and the die thickness on the warpage were studied. The results show that both of the filler percentage and the die thickness has a significant effect on the final warpage level.","PeriodicalId":234537,"journal":{"name":"2005 6th International Conference on Electronic Packaging Technology","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 6th International Conference on Electronic Packaging Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2005.1564637","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13

Abstract

An investigation on the process-induced warpage during the array-molding process of QFN packages was conducted both experimentally and numerically. A series of molding experiments for QFN matrix strips with the model-molding compounds were performed. In the molding experiments, different processing parameters, filler loading and die thickness were used. The warpage was measured by a contact probe coordinate measuring system. A cure-dependent constitutive model for the encapsulating EMC was applied to describe the behavior of the material during the curing process. The cure-dependent material parameters were incorporated into a finite element code MARC and numerical simulations were carried out for the QFN array-molding process. The effects of filler percentage of the molding compound, the curing temperature profiles and the die thickness on the warpage were studied. The results show that both of the filler percentage and the die thickness has a significant effect on the final warpage level.
阵列成型过程中QFN封装翘曲的实验与数值研究
对QFN封装阵列成型过程中工艺引起的翘曲进行了实验和数值研究。对QFN基带进行了一系列模塑实验。在成型实验中,采用了不同的工艺参数、填料的加入量和模具的厚度。采用接触式测头坐标测量系统测量翘曲量。采用固化相关本构模型来描述材料在固化过程中的行为。将与固化相关的材料参数纳入MARC有限元程序,对QFN阵列成型过程进行了数值模拟。研究了模塑料填充量、固化温度分布和模具厚度对翘曲的影响。结果表明,填充料用量和模具厚度对最终翘曲水平均有显著影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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