Challenges in copper 2nd bond quality on nickel palladium leadframe

Tan Kian Heong, F. Harun
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引用次数: 4

Abstract

Nickel-palladium (NiPd) based lead finishes has been one of the options for lead-free electronics. Currently there are different types of NiPd finish in the industry like NiPdAuAg, NiPdAu and rough NiPdAuAg. These preplated lead frame finishes while eliminate the need for plating after assembly/encapsulation, it also has a few challenges especially on the 2nd bond wire bond quality. This is especially obvious when Cu wire bond was introduced. This paper will provide some insight, compare the 2nd bond performance when using Cu wire on both Ag plated frame and NiPd frame. It was observed that stitch pull strength for Cu wire bonding on rough uppf lead frame generally lower than the Ag plated Cu lead frame and percentage of Cu remain after stitch pull for rought µppf lead frame is lesser than the Ag plated lead frame. The different results possible due to different lead frame plating materials, plating thickness and hardness.
镍钯引线框架铜二键质量的挑战
基于镍钯(NiPd)的铅饰面一直是无铅电子产品的选择之一。目前业界有NiPdAuAg、NiPdAu和NiPdAuAg毛坯等不同类型的NiPd整理。这些预镀引线框架饰面虽然消除了组装/封装后电镀的需要,但它也有一些挑战,特别是在第二键合线的键合质量上。当引入铜丝键合时,这一点尤为明显。本文将提供一些见解,比较在镀银框架和NiPd框架上使用铜线的二次键合性能。我们观察到,粗糙的uppf引线框架上的铜线键合的针拔强度通常低于镀银的Cu引线框架,粗糙的uppf引线框架的针拔后的铜残留百分比小于镀银的引线框架。不同的结果可能是由于不同的引线框电镀材料,电镀厚度和硬度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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