Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

T. Yokohira, T. Shimizu, H. Michinishi, Y. Sugiyama, T. Okamoto
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Abstract

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2/sup w/ test patterns, where w is the maximum number of inputs on which any output depends.<>
具有五个输出的组合电路局部穷举测试的最小测试集
本文讨论了具有5个输出的组合电路的依赖矩阵的特征,并证明了这种电路的局部穷举测试的最小测试集总是具有2/sup w/测试模式,其中w是任何输出所依赖的最大输入数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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