T. Yokohira, T. Shimizu, H. Michinishi, Y. Sugiyama, T. Okamoto
{"title":"Minimum test sets for locally exhaustive testing of combinational circuits with five outputs","authors":"T. Yokohira, T. Shimizu, H. Michinishi, Y. Sugiyama, T. Okamoto","doi":"10.1109/ATS.1994.367218","DOIUrl":null,"url":null,"abstract":"In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2/sup w/ test patterns, where w is the maximum number of inputs on which any output depends.<<ETX>>","PeriodicalId":182440,"journal":{"name":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE 3rd Asian Test Symposium (ATS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.1994.367218","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2/sup w/ test patterns, where w is the maximum number of inputs on which any output depends.<>