MoS2 U-shape MOSFET with 10 nm channel length and poly-Si source/drain serving as seed for full wafer CVD MoS2 availability

Kai-Shin Li, Bo-Wei Wu, Lain‐Jong Li, Ming-Yang Li, Chia-Chin Cheng, Cho-Lun Hsu, Chang-Hsien Lin, Yi-Ju Chen, Chun-Chi Chen, C. Wu, Min-Cheng Chen, J. Shieh, W. Yeh, Y. Chueh, Fu-Liang Yang, C. Hu
{"title":"MoS2 U-shape MOSFET with 10 nm channel length and poly-Si source/drain serving as seed for full wafer CVD MoS2 availability","authors":"Kai-Shin Li, Bo-Wei Wu, Lain‐Jong Li, Ming-Yang Li, Chia-Chin Cheng, Cho-Lun Hsu, Chang-Hsien Lin, Yi-Ju Chen, Chun-Chi Chen, C. Wu, Min-Cheng Chen, J. Shieh, W. Yeh, Y. Chueh, Fu-Liang Yang, C. Hu","doi":"10.1109/VLSIT.2016.7573375","DOIUrl":null,"url":null,"abstract":"A U-shape MoS2 pMOSFET with 10nm channel and poly-Si source/drain is demonstrated. The fabrication process is simple. Because the Si S/D serves as the nucleation seed for CVD MoS2 deposition, thin MoS2 is well deposited in the channel region any where over the fully scale oxide coated Si wafer. This is a big step forward toward a low cost multi-layer stacked TMD IC technology.","PeriodicalId":129300,"journal":{"name":"2016 IEEE Symposium on VLSI Technology","volume":"69 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Symposium on VLSI Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIT.2016.7573375","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17

Abstract

A U-shape MoS2 pMOSFET with 10nm channel and poly-Si source/drain is demonstrated. The fabrication process is simple. Because the Si S/D serves as the nucleation seed for CVD MoS2 deposition, thin MoS2 is well deposited in the channel region any where over the fully scale oxide coated Si wafer. This is a big step forward toward a low cost multi-layer stacked TMD IC technology.
MoS2 u形MOSFET,沟道长度为10nm,多晶硅源极/漏极作为全晶圆CVD MoS2可用性的种子
演示了一种具有10nm沟道和多晶硅源极/漏极的u形MoS2 pMOSFET。制作过程很简单。由于Si S/D作为CVD沉积MoS2的成核种子,薄的MoS2在全尺度氧化硅片上的任何通道区域都能很好地沉积。这是迈向低成本多层堆叠TMD IC技术的一大步。
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