Integration Of Comprehensive Testing In Microelectronics Curriculum

Abstract

This paper presents the issues pertinent to Microelectronics/VLSI Education in general, and comprehensive Testing, in particular. Integrated Circuit design employing modem testing methodologies plays a central role in microelectronics and encompasses multiple levels of abstraction: physics, chemistry, logic design, computer architecture and so forth. The Microelectronics/VLSI Educator is challenged to transcend these disparate disciplines and transform an idea into the detailed specifications for a manufactured chip(system). The system must be decomposed into subsystem, subsystem into modules, modules into components, along with exhaustive testing at each stage.