{"title":"Design for Testability of Software-Based Self-Test for Processors","authors":"Masato Nakazato, S. Ohtake, M. Inoue, H. Fujiwara","doi":"10.1109/ATS.2006.38","DOIUrl":null,"url":null,"abstract":"In this paper, the authors propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from the test. The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points to the original design, and it enables at-speed testing and does not induce delay overhead","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.38","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
In this paper, the authors propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from the test. The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points to the original design, and it enables at-speed testing and does not induce delay overhead