Design for Testability of Software-Based Self-Test for Processors

Masato Nakazato, S. Ohtake, M. Inoue, H. Fujiwara
{"title":"Design for Testability of Software-Based Self-Test for Processors","authors":"Masato Nakazato, S. Ohtake, M. Inoue, H. Fujiwara","doi":"10.1109/ATS.2006.38","DOIUrl":null,"url":null,"abstract":"In this paper, the authors propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from the test. The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points to the original design, and it enables at-speed testing and does not induce delay overhead","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.38","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

Abstract

In this paper, the authors propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from the test. The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points to the original design, and it enables at-speed testing and does not induce delay overhead
基于软件的处理器自检可测试性设计
本文提出了一种基于测试程序模板的软件自检测试程序的可测试性设计方法。使用模板的基于软件的自测有一个错误屏蔽的问题,其中在模块的测试生成中检测到的一些错误没有被从测试合成的测试程序检测到。该方法实现了100%的模板级故障效率,从某种意义上说,该方法完全解决了错误掩蔽问题。此外,该方法仅在原始设计的基础上增加了观测点,并且可以进行高速测试,并且不会产生延迟开销
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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