Techniques to increase sequential ATPG performance

Digest of Papers. 1992 IEEE VLSI Test Symposium Pub Date : 1992-04-07 DOI:10.1109/VTEST.1992.232762

E. Macii, A. Meo

引用次数: 4

Abstract

An automatic test pattern generation (ATPG) system for sequential circuits is described. Techniques such as testability measures, 9-valued functions, incompatibility function and fault simulation have been added to the basic algorithm in order to increase the fault coverage and reduce the test generation time. The entire ATPG system has been benchmarked on the set of ISCAS89 circuits.<>

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提高连续ATPG性能的技术

介绍了一种时序电路测试图自动生成(ATPG)系统。在基本算法中加入了可测性测度、9值函数、不兼容函数和故障仿真等技术，提高了故障覆盖率，缩短了测试生成时间。整个ATPG系统已在ISCAS89电路集上进行了基准测试

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Digest of Papers. 1992 IEEE VLSI Test Symposium

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